M.A. Marpaung, E. Handoko, Z. Jalil, M. Alaydrus
In order to study a new microwave absorption properties of single and double layer barium hexaferrite and silica have been investigated in X-band (8.2-12.4 GHz) frequencies. Barium hexaferrite BaFe12O19 was synthesized by ceramic method and Silica SiO2 was prepared from beach sand. Barium hexaferrite and silica SiO2 with a total thickness of 3 mm, 4 mm, 5 mm, 6 mm and 7 mm, were characterized at room temperature using vector network analyser (VNA) Keysight PNA-L N5232A. Reflection loss (RL) of single and double-layer absorbers of barium hexaferrite and silica were calculated and simulated using the transmit line theory. The minimum RL value (less than - 10 dB) of single layer barium hexaferrite is -21 dB at 9 GHz. The minimum RL values (less than - 10 dB) of single layer silica SiO2 is -40 dB at 9.2 GHz with 4 mm of thickness. The results show that double layer absorbing material showed different RL values than single layer of barium hexaferrite BaFe12O19 and silica SiO2. © Published under licence by IOP Publishing Ltd.
Dept. of Physics, Universitas Negeri Jakarta, Jalan Rawamangun Muka, Jakarta, 13220, Indonesia; Dept. of Physics, Syiah Kuala University, Banda Aceh, Indonesia; Dept. of Electrical Engineering, Universitas Mercu Buana, Jalan Meruya Selatan No.1, Jakarta, Indonesia
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